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David C. Joy – författare

Visar alla böcker från författaren David C. Joy.
14 produkter
David C. Joy - Monte Carlo Modeling for Electron Microscopy and Microanalysis, Inbunden
Del 9 - Oxford Series in Optical and Imaging Sciences

Monte Carlo Modeling for Electron Microscopy and Microanalysis

AvDavid C. Joy

Inbunden, Engelska, 1995

2 809 kr

Skickas inom 5-8 vardagar

Patrick Echlin, C.E. Fiori, Joseph Goldstein, David C. Joy, Dale E. Newbury - Advanced Scanning Electron Microscopy and X-Ray Microanalysis, Inbunden

2 439 kr

Skickas inom 10-15 vardagar

Joseph Goldstein, David C. Joy, Alton D. Romig Jr. - Principles of Analytical Electron Microscopy, Inbunden

2 089 kr

Skickas inom 10-15 vardagar

Charles E. Lyman, Dale E. Newbury, Joseph Goldstein, David B. Williams, Alton D. Romig Jr., John Armstrong, Patrick Echlin, Charles Fiori, David C. Joy, Eric Lifshin, Klaus-Rüdiger Peters - Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy, Häftad

1 389 kr

Skickas inom 5-8 vardagar

Joseph Goldstein, Dale E. Newbury, David C. Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda Sawyer, J.R. Michael - Scanning Electron Microscopy and X-Ray Microanalysis, Inbunden

1 529 kr

Skickas inom 10-15 vardagar

Joseph Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, Alton D. Romig Jr., Charles E. Lyman, Charles Fiori, Eric Lifshin - Scanning Electron Microscopy and X-Ray Microanalysis, Häftad

1 409 kr

Skickas inom 10-15 vardagar

Joseph Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, Charles Fiori, Eric Lifshin - Scanning Electron Microscopy and X-Ray Microanalysis, Häftad

1 409 kr

Skickas inom 10-15 vardagar

Joseph Goldstein, Dale E. Newbury, David C. Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda Sawyer, J.R. Michael - Scanning Electron Microscopy and X-Ray Microanalysis, Häftad

1 409 kr

Skickas inom 5-8 vardagar

Edgar Völkl, Lawrence F. Allard, David C. Joy - Introduction to Electron Holography, Häftad

1 409 kr

Skickas inom 10-15 vardagar

David C. Joy - Helium Ion Microscopy, Häftad

709 kr

Skickas inom 10-15 vardagar

Patrick Echlin, C.E. Fiori, Joseph Goldstein, David C. Joy, Dale E. Newbury - Advanced Scanning Electron Microscopy and X-Ray Microanalysis, Häftad

1 449 kr

Skickas inom 10-15 vardagar

Joseph Goldstein, David C. Joy, Alton D. Romig Jr. - Principles of Analytical Electron Microscopy, Häftad

1 819 kr

Skickas inom 3-6 vardagar

Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy - Scanning Electron Microscopy and X-Ray Microanalysis, Inbunden

1 429 kr

Skickas inom 3-6 vardagar

Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy - Scanning Electron Microscopy and X-Ray Microanalysis, Häftad

1 409 kr

Skickas inom 10-15 vardagar