Scanning Electron Microscopy and X-Ray Microanalysis 1
bokomslag Scanning Electron Microscopy and X-Ray Microanalysis
Vetenskap & teknik

Scanning Electron Microscopy and X-Ray Microanalysis

Joseph Goldstein • Dale E Newbury • David C Joy • Charles E Lyman • Patrick Echlin

Pocket

1529:-

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  • 689 sidor
  • 2013
This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.
  • Författare: Joseph Goldstein, Dale E Newbury, David C Joy, Charles E Lyman, Patrick Echlin
  • Format: Pocket/Paperback
  • ISBN: 9781461349693
  • Språk: Engelska
  • Antal sidor: 689
  • Utgivningsdatum: 2013-05-31
  • Förlag: Springer-Verlag New York Inc.

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