Springer Series in Surface Sciences - Böcker

Spin-Polarized Two-Electron Spectroscopy of Surfaces

Kinetics of Evaporation

Optical Characterization of Thin Solid Films

Confocal Raman Microscopy

Kelvin Probe Force Microscopy

From Single Charge Detection to Device Characterization

Ellipsometry of Functional Organic Surfaces and Films

Spin-Polarized Two-Electron Spectroscopy of Surfaces

Surface Plasmon Resonance Sensors

A Materials Guide to Design, Characterization, Optimization, and Usage

Surface Plasmon Resonance Sensors

A Materials Guide to Design, Characterization, Optimization, and Usage

Photoelectron Spectroscopy

Bulk and Surface Electronic Structures

Photoelectron Spectroscopy

Bulk and Surface Electronic Structures

Physics of Thin Film Optical Spectra

An Introduction

Contact-Electrification of Matter

Application of Surface Acoustic Waves in Gas Sensors

Theoretical Models and Advanced Sensor Structures

Laboratory Micro-X-Ray Fluorescence Spectroscopy

Instrumentation and Applications

Lab-on-Fiber Technology

Defects at Oxide Surfaces

Hard X-ray Photoelectron Spectroscopy (HAXPES)

Physics of Thin Film Optical Spectra

An Introduction

Ion Beam Modification of Solids

Ion-Solid Interaction and Radiation Damage

Laboratory Micro-X-Ray Fluorescence Spectroscopy

Instrumentation and Applications

Lab-on-Fiber Technology

Defects at Oxide Surfaces

Electrodeposition of Nanostructured Materials

Optical Characterization of Thin Solid Films

Confocal Raman Microscopy

Kelvin Probe Force Microscopy

From Single Charge Detection to Device Characterization

Ellipsometry of Functional Organic Surfaces and Films

Hard X-ray Photoelectron Spectroscopy (HAXPES)