USA) Seiler, David G. (National Institute of Standards and Technology, Hillsboro, OR - Böcker
Visar alla böcker från författaren USA) Seiler, David G. (National Institute of Standards and Technology, Hillsboro, OR.
1 produkt
1 produkt
Metrology and Diagnostic Techniques for Nanoelectronics
Av Zhiyong Ma, David G. Seiler, USA) Ma, Zhiyong (Intel Corporation, Hillsboro, OR, USA) Seiler, David G. (National Institute of Standards and Technology, Hillsboro, OR
Inbunden, Engelska, 2016
5 829 kr
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