USA) Seiler, David G. (National Institute of Standards and Technology, Hillsboro, OR - Böcker

Visar alla böcker från författaren USA) Seiler, David G. (National Institute of Standards and Technology, Hillsboro, OR.

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Metrology and Diagnostic Techniques for Nanoelectronics

AvZhiyong Ma,David G. Seiler,USA) Ma, Zhiyong (Intel Corporation, Hillsboro, OR,USA) Seiler, David G. (National Institute of Standards and Technology, Hillsboro, OR

Inbunden, Engelska, 2016

5 729 kr

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