USA) Ma, Zhiyong (Intel Corporation, Hillsboro, OR - Böcker

Visar alla böcker från författaren USA) Ma, Zhiyong (Intel Corporation, Hillsboro, OR.

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Böcker

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Zhiyong Ma, David G. Seiler, USA) Ma, Zhiyong (Intel Corporation, Hillsboro, OR, USA) Seiler, David G. (National Institute of Standards and Technology, Hillsboro, OR - Metrology and Diagnostic Techniques for Nanoelectronics, Inbunden

Metrology and Diagnostic Techniques for Nanoelectronics

Av Zhiyong Ma, David G. Seiler, USA) Ma, Zhiyong (Intel Corporation, Hillsboro, OR, USA) Seiler, David G. (National Institute of Standards and Technology, Hillsboro, OR

Inbunden, Engelska, 2016

5 829 kr

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