Ion Spectroscopies for Surface Analysis

Inbunden, Engelska, 1991

AvAlvin W. Czanderna,David M. Hercules,Alvin W Czanderna,David M Hercules

1 109 kr

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Determining the elemental composition of surfaces is an essential measurement in characterizing solid surfaces. Typically, atoms and molecules on the surface and in the near surface region may be excited by photons, electrons, ions, or neutrals, and the detected particles are emitted, ejected, or scattered ions or electrons.

Produktinformation

Utgivningsdatum1991-09-30
Mått152 x 229 x 32 mm
Vikt889 g
FormatInbunden
SpråkEngelska
SerieMethods of Surface Characterization
Antal sidor469
Upplaga1991
FörlagKluwer Academic Publishers Group
ISBN9780306437922

Tillhör följande kategorier

1. Overview of Ion Spectroscopies for Surface Compositional Analysis.- Glossary of Acronyms.- 1. Purposes.- 2. Introduction.- 3. Overview of Compositional Surface Analysis by Ion Spectroscopies.- 4. Ion Spectroscopies Using Ion Stimulation.- 5. Ion Spectroscopies Using Ion Detection.- References.- 2. Surface Structure and Reaction Studies by Ion-Solid Collisions.- 1. Introduction.- 2. The Experimental Approach.- 3. How to View the Process.- 4. Electronic Effects.- 5. Surface Characterization with Ion Bombardment.- 6. Conclusions and Prospects.- References.- 3. Particle-Induced Desorption Ionization Techniques for Organic Mass Spectrometry.- 1. Introduction.- 2. Spectral Effects of Primary Beam Parameters.- 3. Properties of Secondary Ions.- 4. Sample Preparation.- 5. Special Techniques.- 6. Future Prospects.- References.- 4. Laser Resonant and Nonresonant Photoionization of Sputtered Neutrals.- Glossary of Symbols and Acronyms.- 1. Introduction.- 2. Photoionization.- 3. Experimental Details.- 4. Artifacts, Quantitation, Capabilities, and Limitations.- 5. Applications.- 6. Future Directions.- 7. Summary.- References.- 5. Rutherford Backscattering and Nuclear Reaction Analysis.- 1. Introduction.- 2. Principles of the Methods.- 2. Apparatus.- 4. Quantitative Analysis and Sensitivity.- 5. Ion Scattering as a Structural Tool.- 6. Applications.- 7. Outstanding Strengths of RBS in Relation to AES, XPS, and SIMS.- References.- 6. Ion Scattering Spectroscopy.- 1. Introduction.- 2. Basic Principles.- 3. Experimental Techniques.- 4. Calculations.- 5. Analysis of Surface Composition.- 6. Structure of Crystalline Surfaces.- References.- 7. Comparison of SIMS, SNMS, ISS, RBS, AES, and XPS Methods for Surface Compositional Analysis.- 1. Purpose.- 2. Introduction.- 3. Comparison Categories or Criteria.- 4. The Surface Analysis Community.- References.- Standard Terminology Relating to Surface Analysis.- Density of Large-Diameter Ion Beams for Sputter Depth Profiling of Solid Surfaces.- Standard Guide for Specimen Handling in Auger Electron Spectroscopy, X-Ray Photoelectron Spectroscopy, and Secondary Ion Mass Spectrometry.- Standard Practice for Reporting Sputter Depth Profile Data in Secondary Ion Mass Spectrometry (SIMS).