Nanometer-scale Defect Detection Using Polarized Light
Pierre-Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami
2 289 kr
1 259 kr
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Embedded Mechatronic Systems 2: Analysis of Failures, Modeling, Simulation and Optimization presents advances in research within the field of mechatronic systems, which integrates reliability into the design process. Providing many detailed examples, this book develops a characterization methodology for faults in mechatronic systems. It analyzes the multi-physical modeling of faults, revealing weaknesses in design and failure mechanisms. This development of meta-models enables us to simulate effects on the reliability of conditions of use and manufacture.