Electromigration and Electronic Device Degradation

Inbunden, Engelska, 1994

3 839 kr

Beställningsvara. Skickas inom 5-8 vardagar. Fri frakt för medlemmar vid köp för minst 249 kr.

Addresses electromigration failure modes in electronics covering both theory and experiments. Reviews silicon and GaAs technologies. Various rate controlling details are summarized including an investigation of temperature dependence. Concludes with a discussion regarding current status and future plans for electromigration resistant advanced metallization systems for VLSI.

Produktinformation

Utgivningsdatum1994-01-14
Mått160 x 240 x 20 mm
Vikt680 g
FormatInbunden
SpråkEngelska
Antal sidor360
FörlagJohn Wiley & Sons Inc
ISBN9780471584896

Tillhör följande kategorier

Reliability and Electromigration Degradation of GaAs MicrowaveMonolithic Integrated Circuits (A. Christou). Simulation and Computer Models for Electromigration (P.Tang). Temperature Dependencies on Electromigration (M. Pecht & P.Lall). Electromigration and Related Failure Mechanisms in VLSIMetallizations (A. Christou & M. Peckerar). Metallic Electromigration Phenomena (S. Krumbein). Theoretical and Experimental Study of Electromigration (J.Zhao). GaAs on Silicon Performance and Reliability (P. Panayotatos, etal.). Electromigration and Stability of Multilayer Metal-SemiconductorSystems on GaAs (A. Christou). Electrothermomigration Theory and Experiments in Aluminum Thin FilmMetallizations (A. Christou). Reliable Metallization for VLSI (M. Peckerar). Index.

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Electromigration and Electronic Device Degradation

Inbunden, Engelska, 1994

AvChristou,Aris Christou

3 839 kr

Beställningsvara. Skickas inom 5-8 vardagar. Fri frakt för medlemmar vid köp för minst 249 kr.

Produktinformation

Utgivningsdatum1994-01-14
Mått160 x 240 x 20 mm
Vikt680 g
FormatInbunden
SpråkEngelska
Antal sidor360
FörlagJohn Wiley & Sons Inc
ISBN9780471584896

Tillhör följande kategorier

Reliability and Electromigration Degradation of GaAs MicrowaveMonolithic Integrated Circuits (A. Christou). Simulation and Computer Models for Electromigration (P.Tang). Temperature Dependencies on Electromigration (M. Pecht & P.Lall). Electromigration and Related Failure Mechanisms in VLSIMetallizations (A. Christou & M. Peckerar). Metallic Electromigration Phenomena (S. Krumbein). Theoretical and Experimental Study of Electromigration (J.Zhao). GaAs on Silicon Performance and Reliability (P. Panayotatos, etal.). Electromigration and Stability of Multilayer Metal-SemiconductorSystems on GaAs (A. Christou). Electrothermomigration Theory and Experiments in Aluminum Thin FilmMetallizations (A. Christou). Reliable Metallization for VLSI (M. Peckerar). Index.