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Vetenskap & teknik
X-Ray Scattering Techniques for Epitaxial Oxide Thin Films
Daniel Sando • Paul G Evans • Nagarajan Valanoor
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The first chapter considers laboratory-based X-ray diffraction (XRD) methods: the indispensable X-ray characterization methods used for phase analysis, epitaxial relationship determination, advanced analytical and data fitting techniques, and grazing incidence diffraction.
- Format: Inbunden
- ISBN: 9789819659449
- Språk: Engelska
- Antal sidor: 186
- Utgivningsdatum: 2025-08-12
- Förlag: Springer Nature Switzerland AG