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This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.
- Illustratör: Bibliographie
- Format: Pocket/Paperback
- ISBN: 9789811074691
- Språk: Engelska
- Antal sidor: 815
- Utgivningsdatum: 2017-12-22
- Förlag: Springer Verlag, Singapore