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The book's objective is to present the capabilities of state-of-the-art synchrotron radiation and scanning probe microscopy techniques, together with general theory work, in elucidating the fundamental electronic and structural properties of semiconductor and metal surfaces, interfaces, nanostructures, layers and diverse biological systems.
Synchrotron-Based Core Level Spectroscopy; Time Resolved Energy Dispersive X-Ray Reflectometry as a Tool for Material Science Studies; Chiral Silicon Nanowires; Broken-Symmetry States at Surfaces; Electronic Transport in Quasi One-Dimensional Nanostructures; Optical and Electron Energy Loss Spectra of Liquid Water; Microradiology Imaging; Nanostructures Induced by the Absorption of Fullerenes; Scanning Probe Microscopy.