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An expert integration of digital twin technology and advanced simulation methods for the design and optimization of electronic packaging systems In Stochastic Finite Element Modeling in Electronic Packaging, distinguished researcher Liu Chu delivers an expert discussion of the latest advanced numerical methods and modeling techniques specific to electronic packaging. The book supplements its explanations with original MATLAB and ANSYS (APDL) code that can be applied immediately. It also includes robust examples that draw on a comprehensive description of the mechanics of electronic packaging modeling. Chu explains the fundamentals of modeling logic and concepts in an accessible way that is ideal for beginners to the topic. She demonstrates practical guides and benchmarks that will assist readers in the testing, measurement, and modeling of their own materials. Readers will also find: A thorough introduction to a modeling approach that focuses on digital twins and big data applications, including Monte Carlo SamplingComprehensive explorations of benchmarks, testing, measurement, and modelingPractical discussions of theoretical finite element models in electronic packagingComplete treatments of the fundamentals of modeling logic and conceptsPerfect for undergraduate and graduate students in electrical engineering and computer science, Stochastic Finite Element Modeling in Electronic Packaging will also benefit practicing electronic design engineers and academic researchers with an interest in electronic packaging and materials science.
Liu Chu, PhD, is an Associate Professor, School of Electronic and Information Engineering, Tongji University. Her research is primarily focused on uncertainty quantification in stochastic defects, numerical simulations for electronic packaging, and the development of advanced computational mechanics methods.
About the Author xiPreface xiii 1 Overview 12 Electronic Packaging 73 Random Sampling Methods 234 Random Fields and Stochastic Processes 395 Reliability Prediction 576 Finite Element Method 857 Nonlinear Stochastic Finite Element Method 1158 Random Shear Stress and Thermal Temperature 1519 Material Uncertainty in Electromigration 18110 Mechanical Reliability in the Replaceable Integrated Chiplet Assembly 20311 Kriging Surrogate Model 21512 Digital Twins Based on SFEM 243Appendix 259Index 269