Scanning Nonlinear Dielectric Microscopy

Yasuo Cho graduated in 1980 from Tohoku University in electrical engineering department. In 1985 he became a research associate at Research Institute of Electrical Communication Tohoku University. In 1990, he received an associate professorship from Yamaguchi University. He then became an associate professor in 1997 and a full professor in 2001 at Research Institute of Electrical Communication Tohoku University. During this time, his main research interests included nonlinear phenomena in ferroelectric materials and their applications, research on the scanning nonlinear dielectric microscopy (SNDM), and research on using the SNDM in next-generation ultrahigh density ferroelectric data storage (SNDM ferroelectric probe memory).

• 1. Principals of scanning nonlinear dielectric microscopy for measuring ferroelectric and dielectric polarization2. Ferroelectric polarization measurement3. Three-dimensional polarization measurement4. Ultra high-density ferroelectric data storage using scanning nonlinear dielectric microscopy5. Linear permittivity measurement by scanning nonlinear dielectric microscopy6. Noncontact scanning nonlinear dielectric microscopy7. Scanning nonlinear dielectric potentiometry for measurement of the potential induced by atomic dipole measurements8. Principles of scanning nonlinear dielectric microscopy for semiconductor measurements9. Carrier distribution measurement in semiconductor materials and devices10. Super-higher-order scanning nonlinear dielectric microscopy11. Local deep-level transient spectroscopy12. Time-resolved scanning nonlinear dielectric microscopy