bokomslag Modeling Nanoscale Imaging in Electron Microscopy
Vetenskap & teknik

Modeling Nanoscale Imaging in Electron Microscopy

Thomas Vogt Wolfgang Dahmen Peter Binev

Inbunden

1999:-

Funktionen begränsas av dina webbläsarinställningar (t.ex. privat läge).

Uppskattad leveranstid 7-11 arbetsdagar

Fri frakt för medlemmar vid köp för minst 249:-

Andra format:

  • 182 sidor
  • 2012
Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.
  • Författare: Thomas Vogt, Wolfgang Dahmen, Peter Binev
  • Illustratör: 40 schwarz-weiße Tabellen 95 schwarz-weiße und 10 farbige Abbildungen
  • Format: Inbunden
  • ISBN: 9781461421900
  • Språk: Engelska
  • Antal sidor: 182
  • Utgivningsdatum: 2012-03-02
  • Förlag: Springer-Verlag New York Inc.