Microprobe Characterization of Optoelectronic Materials

Inbunden, Engelska, 2002

8 689 kr

Beställningsvara. Skickas inom 7-10 vardagar

Fri frakt för medlemmar vid köp för minst 249 kr.

Each chapter in this book is written by a group of leading experts in one particular type of microprobe technique. They emphasize the ability of that technique to provide information about small structures (i.e. quantum dots, quantum lines), microscopic defects, strain, layer composition, and its usefulness as diagnostic technique for device degradation. Different types of probes are considered (electrons, photons and tips) and different microscopies (optical, electron microscopy and tunneling). It is an ideal reference for post-graduate and experienced researchers, as well as for crystal growers and optoelectronic device makers.

Produktinformation

Utgivningsdatum2002-11-15
Mått152 x 229 x undefined mm
Vikt1 065 g
FormatInbunden
SpråkEngelska
Antal sidor730
FörlagTaylor & Francis Inc
ISBN9781560329411

Tillhör följande kategorier

Juan Jiménez is a Professor at the University of Valladolid, Spain, working in the field of microscopic characterization of semiconductors, using electron (Cathodoluminescence) and optical (photoluminescence, Raman scattering and photocurrent) beams. He has studied the local properties and uniformity of GaAs, SiC, InP and other semiconductors. He received his degree in Physics from the University of Valladolid in 1975 and his PhD from Valladolid in 1979. He undertook postdoctoral work at the University of Montpellier, France from 1978-1981 and received a PhD from Montpellier University in 1981.

1. Photoluminescence Imaging2. MicroRaman Spectroscopy of Semiconductors: Principles and Applications3. Near-Field Scanning Optical Microscopy of Semiconductor Nanostructures4. Cross-sectional Scanning Tunneling Microscopy Studies of Heterostructures5. Application of Transmission Electron Microscopy to Study Interfaces in Optoelectronic Materials6. Electron Beam Induced Luminescence Studies of Low-dimensional Semiconductor Structures7. X-ray Topography8. Selective Etching and Complementary Microprobe Techniques (SFM, EBIC)