Materials Reliability Issues in Microelectronics: Volume 225
Inbunden, Engelska, 1991
719 kr
Slutsåld
With the increased complexity of modern integrated circuits, it is important that reliability problems be attacked properly with the appropriate tools. This volume recognizes that almost all reliability problems are materials problems, and helps to put 'reliabilty physics' on a firm scientific foundation. Topics include: electromigration; stress effects on reliability; stress and packaging; metallization; device, oxide and dielectric reliability; new investigative techniques; corrosion.
Produktinformation
- Utgivningsdatum1991-10-22
- Mått155 x 235 x 25 mm
- Vikt700 g
- SpråkEngelska
- SerieMRS Proceedings
- Antal sidor382
- FörlagMaterials Research Society
- EAN9781558991194