Materials Reliability in Microelectronics IV: Volume 338

Peter Børgesen, John E. Sanchez, Jr., Paul H. Townsend, Timothy P. Weihs

Kenneth P. Rodbell, William F. Filter, Harold J. Frost, Paul S. Ho, New York) Rodbell, Kenneth P. (IBM T J Watson Research Center, New Hampshire) Frost, Harold J. (Dartmouth College, Austin) Ho, Paul S. (University of Texas

Shefford P. Baker, Peter Børgesen, Caroline A. Ross, Paul H. Townsend, Cynthia A. Volkert

Peter Børgesen, Klavs F. Jensen, Klavs F Jensen, Roger A Pollak

J. Joseph Clement, William F. Filter, Patrick M. Lenahan, Anthony S. Oates, Robert Rosenberg

Peter Børgesen, Kenneth A. Jackson, Robert C. Sundahl, King-Ning Tu

James A. Knapp, Peter Børgesen, James A Knapp, Raymond A Zuhr

David E. Laughlin, Kenneth P. Rodbell, David E Laughlin, Kenneth P Rodbell, Olivier Thomas, Bing Zhang

William F. Filter, Kamesh Gadepally, A. Lindsay Greer, Anthony S. Oates, Robert Rosenberg