Hoppa till sidans huvudinnehåll

Machine Vision Inspection Systems, Image Processing, Concepts, Methodologies, and Applications

Inbunden, Engelska, 2020

AvMuthukumaran Malarvel,Soumya Ranjan Nayak,Surya Narayan Panda,Prasant Kumar Pattnaik,Nittaya Muangnak

2 649 kr

Beställningsvara. Skickas inom 7-10 vardagar. Fri frakt för medlemmar vid köp för minst 249 kr.


This edited book brings together leading researchers, academic scientists and research scholars to put forward and share their experiences and research results on all aspects of an inspection system for detection analysis for various machine vision applications. It also provides a premier interdisciplinary platform to present and discuss the most recent innovations, trends, methodology, applications, and concerns as well as practical challenges encountered and solutions adopted in the inspection system in terms of image processing and analytics of machine vision for real and industrial application.Machine vision inspection systems (MVIS) utilized all industrial and non-industrial applications where the execution of their utilities based on the acquisition and processing of images. MVIS can be applicable in industry, governmental, defense, aerospace, remote sensing, medical, and academic/education applications but constraints are different. MVIS entails acceptable accuracy, high reliability, high robustness, and low cost. Image processing is a well-defined transformation between human vision and image digitization, and their techniques are the foremost way to experiment in the MVIS. The digital image technique furnishes improved pictorial information by processing the image data through machine vision perception. Digital image pro­cessing has widely been used in MVIS applications and it can be employed to a wide diversity of problems particularly in Non-Destructive testing (NDT), presence/absence detection, defect/fault detection (weld, textile, tiles, wood, etc.,), automated vision test & measurement, pattern matching, optical character recognition & verification (OCR/OCV), barcode reading and traceability, medical diagnosis, weather forecasting, face recognition, defence and space research, etc. This edited book is designed to address various aspects of recent methodologies, concepts and research plan out to the readers for giving more depth insights for perusing research on machine vision using image processing techniques.

Produktinformation

  • Utgivningsdatum2020-07-07
  • Mått10 x 10 x 10 mm
  • Vikt454 g
  • FormatInbunden
  • SpråkEngelska
  • SerieMachine Vision Inspection Systems
  • Antal sidor256
  • FörlagJohn Wiley & Sons Inc
  • ISBN9781119681809
Hoppa över listan

Du kanske också är intresserad av

Smart Sensor Networks Using AI for Industry 4.0

Soumya Ranjan Nayak, Biswa Mohan Sahoo, Muthukumaran Malarvel, Jibitesh Mishra, India) Nayak, Soumya Ranjan (Amity University Uttar Pradesh, India) Sahoo, Biswa Mohan (Amity University Uttar Pradesh, Muthukumaran (Chitkara University) Malarvel

Inbunden

2 209 kr

Smart Sensor Networks Using AI for Industry 4.0

Soumya Ranjan Nayak, Biswa Mohan Sahoo, Muthukumaran Malarvel, Jibitesh Mishra, India) Nayak, Soumya Ranjan (Amity University Uttar Pradesh, India) Sahoo, Biswa Mohan (Amity University Uttar Pradesh, Muthukumaran (Chitkara University) Malarvel

Häftad

859 kr

Intelligent Fractal-Based Image Analysis

Soumya Ranjan Nayak, Janmenjoy Nayak, Khan Muhammad, Yeliz Karaca, India) Nayak, Soumya Ranjan (Assistant Professor, Amity School of Engineering and Technology, Amity University Uttar Pradesh, Noida, India) Nayak, Janmenjoy (Department of Computer Science, Maharaja Sriram Chandra Bhanja Deo (MSCBD) University, Mayurbhanj, South Korea) Muhammad, Khan, Ph.D. (Assistant Professor, Department of Interaction Science and Director of Visual Analytics for Knowledge Laboratory (VIS2KNOW Lab), Sungkyunkwan University, Seoul, USA) Karaca, Yeliz (Assistant Professor of Applied Mathematics and Researcher, University of Massachusetts Medical School, Worcester, Massachusetts

Häftad

1 889 kr

  • Nyhet

Deep Learning in Genome Mapping

Soumya Ranjan Nayak, Shailendra Pratap Singh, Jagendra Singh, Prabhishek Singh, Manoj Diwakar, Deepak Garg

Inbunden

2 649 kr

Deep Learning for Sustainable Agriculture

Ramesh Chandra Poonia, Vijander Singh, Soumya Ranjan Nayak, India) Poonia, Ramesh Chandra, PhD (Professor, Department of Computer Science, CHRIST (Deemed to be University), Bangalore, Karnataka, India) Singh, Vijander (Associate Professor, Department of Computer Science and Engineering, Manipal University Jaipur, India) Nayak, Soumya Ranjan (Assistant Professor, Amity School of Engineering and Technology, Amity University Uttar Pradesh, Noida

Häftad

1 819 kr