ISTFA 2017 Proceedings from the 43rd International Symposium for Testing and Failure Analysis
Häftad, Engelska, 2018
2 279 kr
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The theme for the November 2017 conference is Striving for 100% Success Rate. Papers focus on the tools and techniques needed for maximizing the success rate in every aspect of the electronic device failure analysis process.
Produktinformation
- Utgivningsdatum2018-07-30
- Mått152 x 229 x undefined mm
- Vikt1 588 g
- FormatHäftad
- SpråkEngelska
- Antal sidor660
- FörlagA S M International
- ISBN9781627081504