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X-Ray Fluorescence analysis (XRF) is a multi-elemental and nondestructive analytical method used in research and industrial applications. This book provides self-contained modules featuring XRF instrumentation, quantification methods, and other applications. It gives a survey of the theoretical fundamentals, analytical instrumentation, and more.
Produktinformation
Utgivningsdatum2006-06-22
Mått155 x 235 x 56 mm
Vikt1 490 g
FormatInbunden
SpråkEngelska
Antal sidor863
Upplaga2006
FörlagSpringer-Verlag Berlin and Heidelberg GmbH & Co. KG
X-ray tubes.- Radioisotopes.- Synchrotron radiation source.- Mirror optics.- Diffraction optics.- Optics for monochromators.- Focusing diffraction optics.- Refraction X-ray optics.- X-ray detectors and signal processing.- High resolution imaging X-ray CCD spectrometers.- Wavelength dispersive XRF and a comparison with EDS.- Quantitative analysis.- Specimen preparation.- Micro-X-ray fluorescence spectroscopy.- Micro XRF with synchrotron radiation.- TXRF wafer analysis.- Analysis of layers.- Environmental studies.- Geology, mining, metallurgy.- Arts and archaeology.- XRF-application in numismatics.- Analysis for forensic investigations.- X-Ray fluorescence analysis in the life sciences.- Non-invasive identification of chemical compounds by EDXRS.- X-ray safety and protection.- Useful data sources and links.
Frans H. van Eemeren, Bart Garssen, Erik C. W. Krabbe, A. Francisca Snoeck Henkemans, Bart Verheij, Jean H. M. Wagemans, Frans H. Van Eemeren, Frans H. Van Eemeren