Fringe Pattern Analysis for Optical Metrology
Theory, Algorithms, and Applications
Inbunden, Engelska, 2014
Av Manuel Servin, J. Antonio Quiroga, Moises Padilla, Mexico) Servin, Manuel (Nationale Superieure des Telecommunications, France; Centro de Investigaciones en Optica AC, Spain) Quiroga, J. Antonio (Universidad Complutense de Madrid, Mexico) Padilla, Moises (Centro de Investigaciones en Optica AC
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Fringe Pattern Analysis for Optical Metrology: Theory, Algorithms, and ApplicationsThe main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe pattern analysis applied to optical metrology. A major novelty of this work is the presentation of a unified theoretical framework based on the Fourier description of phase shifting interferometry using the Frequency Transfer Function (FTF) along with the theory of Stochastic Process for the straightforward analysis and synthesis of phase shifting algorithms with desired properties such as spectral response, detuning and signal-to-noise robustness, harmonic rejection, etc.
Produktinformation
- Utgivningsdatum2014-07-02
- Mått175 x 251 x 24 mm
- Vikt898 g
- FormatInbunden
- SpråkEngelska
- Antal sidor344
- FörlagWiley-VCH Verlag GmbH
- ISBN9783527411528