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Field Emission Scanning Electron Microscopy

New Perspectives for Materials Characterization

Häftad, Engelska, 2017

Av Nicolas Brodusch, Hendrix Demers, Raynald Gauvin, Hendrix DeMers

979 kr

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This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage

Produktinformation

  • Utgivningsdatum2017-10-06
  • Mått155 x 235 x undefined mm
  • FormatHäftad
  • SpråkEngelska
  • SerieSpringerBriefs in Applied Sciences and Technology
  • Antal sidor137
  • FörlagSpringer Verlag, Singapore
  • ISBN9789811044328