Defect and Impurity Engineered Semiconductors and Devices: Volume 378
Inbunden, Engelska, 1995
Av I. Akasaki, S. Ashok, J. Chevallier, N. M. Johnson, B. L. Sopori, Japan) Akasaki, I. (Meijo University, S. (Pennsylvania State University) Ashok, California) Johnson, N. M. (Xerox Palo Alto Research Center, Stanford University, Colorado) Sopori, B. L. (National Renewable Energy Laboratory, Golden
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Fri frakt för medlemmar vid köp för minst 249 kr.Defect engineering has come of age. That theme is well documented by both the academic and industrial research communities in this book from MRS. Going beyond defect control, the book explores the engineering of desired properties in semiconductor materials and devices through the deliberate introduction and manipulation of defects and impurities. Papers are grouped around ten distinct topics covering materials, processing and devices. Topics include: grown-in defects in bulk crystals; grown-in defects in thin films; gettering and related phenomena; hydrogen interaction with semiconductors; defect issues in widegap semiconductors; defect characterization; ion implantation and process-induced defects; defects in devices; interfaces, quantum wells and superlattices; and defect properties, reaction, activation and passivation.
Produktinformation
- Utgivningsdatum1995-10-16
- Mått160 x 237 x 62 mm
- Vikt1 700 g
- FormatInbunden
- SpråkEngelska
- SerieMRS Proceedings
- Antal sidor1 082
- FörlagMaterials Research Society
- ISBN9781558992818