Computer Simulation Tools for X-ray Analysis

Prof. Dr. Sérgio Luiz Morelhão received his PhD in Applied Physics from University of Campinas (UNICAMP), Brazil, in 1994 (highlight: theoretical framework and applications of hybrid reflections of X-rays in semiconductor devices).  Postdoc in Material Science and Engineering at Carnegie Mellon University, USA, in 1996 (highlight: X-ray topography for understanding the rule of dislocation reactions in silicon solar cells grown from dendritic seeds). Postdoc in synchrotron radiation at the Brazilian Synchrotron Laboratory in 1996/1997 (building of the 1st X-ray diffraction beam line). Faculty at University of São Paulo since 1997 (highlights: theory and experiments for solving the phase problem in X-ray crystallography; application of phase contrast X-ray imaging for studying eye cataract disease; and advanced methods for characterizing nanostructured devices. He is author of more than 50 research papers on X-rays, most of which as the leading author.

• Radiation-electron (free electron) elementary interaction.- Scattering of X-rays by distributions of free electrons.- Atoms and molecules.- X-ray absorption.- Low correlated systems: gases and dilute solutions.- Complex systems I: short-range correlations.- Complex systems II: arbitrary long-range correlations.- Crystals.- Application of kinematic diffraction.- Introduction to dynamical diffraction.