Advances in X-Ray Analysis

Volume 35B

Häftad, Engelska, 2012

AvC.S. Barrett,John V. Gilfrich,Ting C. Huang,Ron Jenkins,G.J. McCarthy,Paul K. Predecki,R. Ryon,Deane K. Smith

709 kr

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Produktinformation

Utgivningsdatum2012-11-21
Mått170 x 244 x 35 mm
Vikt1 100 g
FormatHäftad
SpråkEngelska
Antal sidor641
FörlagSpringer-Verlag New York Inc.
ISBN9781461365327

Tillhör följande kategorier

Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrumentation, Techniques, and Reference Materials. Stress Determination by Diffraction Methods. XRD Profile Fitting, Crystallite Size and Strain Determination. XRD Applications: Detection Limits, Superconductors, Organics, Minerals. Mathematical Methods in XRay Spectrometry (XRS). Thin Film and Surface Characterization by XRS and XPS. Total Reflection XRS. XRS Techniques and Instrumentation. XRS Applications. XRay Imaging and Tomography. 161 articles. Index.