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Plasmon Coupling Physics, Wave Effects and their Study by Electron Spectroscopies, Volume 222 in the Advances in Imaging and Electron Physics serial, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

Specific chapters in this release cover Phase retrieval methods applied to coherent imaging, X-ray phase-contrast imaging: a broad overview of some fundamentals, Graphene and borophene as nanoscopic materials for electronics - with review of the physics, and more.



  • Provides the authority and expertise of leading contributors from an international board of authors
  • Presents the latest release in the Advances in Imaging and Electron Physics series
  • Updated release includes the latest information on the Plasmon Coupling Physics, Wave Effects and their Study by Electron Spectroscopies

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Aberration Theory in Electron and Ion Optics

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The Beginnings of Electron Microscopy - Part 1

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Advances in Imaging and Electron Physics

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Del 221

The Beginnings of Electron Microscopy - Part 2

Peter W. Hawkes, Martin H�tch, Martin Hÿtch, France) Hawkes, Peter W. (Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France) Hytch, Martin (Senior Scientist, French National Centre for Research (CNRS), Toulouse, Martin Hÿtch, Martin Hytch

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Del 223

Advances in Imaging and Electron Physics

Martin H�tch, Peter W. Hawkes, Martin Hÿtch, France) Hytch, Martin (Senior Scientist, French National Centre for Research (CNRS), Toulouse, France) Hawkes, Peter W. (Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, Martin Hÿtch

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