Del 223 - Advances in Imaging and Electron Physics
Advances in Imaging and Electron Physics
Inbunden, Engelska, 2022
Av Martin H�tch, Peter W. Hawkes, Martin Hÿtch, France) Hytch, Martin (Senior Scientist, French National Centre for Research (CNRS), Toulouse, France) Hawkes, Peter W. (Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, Martin Hÿtch
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Fri frakt för medlemmar vid köp för minst 249 kr.Advances in Imaging and Electron Physics, Volume 224 highlights new advances in the field, with this new volume presenting interesting chapters on Measuring elastic deformation and orientation gradients by scanning electron microscopy - conventional, new and emerging methods, Development of an alternative global method with high angular resolution, Implementing the new global method, Numerical validation of the method and influence of optical distortions, and Applications of the method.
- Provides the authority and expertise of leading contributors from an international board of authors
- Presents the latest release in the Advances in Imaging and Electron Physics series
- Updated release includes the latest information on Measuring elastic deformation and orientation gradients by scanning electron microscopy - conventional, new and emerging methods
Produktinformation
- Utgivningsdatum2022-08-25
- Mått152 x 229 x undefined mm
- Vikt540 g
- FormatInbunden
- SpråkEngelska
- SerieAdvances in Imaging and Electron Physics
- Antal sidor266
- FörlagElsevier Science
- ISBN9780323988636