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Lock-in Thermography

Basics and Use for Evaluating Electronic Devices and Materials

Inbunden, Engelska, 2019

Av Otwin Breitenstein, Wilhelm Warta, Martin C. Schubert

2 249 kr

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This book discusses lock-in thermography (LIT) as a dynamic variant of the widely known IR thermography. It focuses on applications to electronic devices and materials, but also includes chapters addressing non-destructive evaluation. Periodically modulating heat sources allows a much-improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. Reviewing various experimental approaches to LIT, particularly the commercial LIT systems available, this 3rd edition introduces new LIT applications, such as illuminated LIT applied to solar cells, non-thermal LIT lifetime mapping and LIT application to spin caloritronics problems. Numerous LIT investigation case studies are also included.

Produktinformation

  • Utgivningsdatum2019-01-22
  • Mått155 x 235 x 25 mm
  • Vikt682 g
  • FormatInbunden
  • SpråkEngelska
  • SerieSpringer Series in Advanced Microelectronics
  • Antal sidor321
  • Upplaga3
  • FörlagSpringer International Publishing AG
  • ISBN9783319998244