High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip
Inbunden, Engelska, 2017
1 409 kr
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This book introduces a novel framework for accurately modeling the errors in nanoscale CMOS technology and developing a smooth tool flow at high-level design abstractions to estimate and mitigate the effects of errors. The book presents novel techniques for high-level fault simulation and reliability estimation as well as architecture-level and system-level fault tolerant designs. It also presents a survey of state-of-the-art problems and solutions, offering insights into reliability issues in digital design and their cross-layer countermeasures.
Produktinformation
- Utgivningsdatum2017-07-05
 - Mått155 x 235 x 18 mm
 - Vikt500 g
 - FormatInbunden
 - SpråkEngelska
 - SerieComputer Architecture and Design Methodologies
 - Antal sidor197
 - Upplaga17001
 - FörlagSpringer Verlag, Singapore
 - ISBN9789811010729