VLSI Test Principles and Architectures: Design for Testability

Häftad, Engelska, 2006

AvLaung-Terng Wang,Cheng-Wen Wu,Xiaoqing Wen

869 kr

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Produktinformation

Utgivningsdatum2006-07-21
FormatHäftad
SpråkEngelska
Antal sidor808
FörlagMorgan Kaufmann Publishers
ISBN9781493300860

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