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Test and Design-for-Testability in Mixed-Signal Integrated Circuits deals with test and design for test of analog and mixed-signal integrated circuits. Besides these specification-driven testing techniques, fault-driven approaches are described as they offer potential solutions which are more similar to digital test methods.
0 Introduction.- 1 Mixed-Signal Test.- 2 Analog and Mixed Signal Test Bus: IEEE 1149.4 Test Standard.- 3 Test of A/D Converters.- 4 Phased Locked Loop Test Methodologies.- 5 Behavioral Testing of Mixed-Signal Circuits.- 6 Behavioral Modeling of Multistage ADCs and its Use for Design, Calibration and Test.- 7 DFT and BIST Techniques for Embedded Analog Integrated Filters.- 8 Oscillation-based Test Strategies.
Gloria Huertas Sánchez, Diego Vázquez García de la Vega, Adoración Rueda Rueda, Jose Luis Huertas Díaz, Gloria Huertas Sánchez, Diego Vázquez García de la Vega, Adoración Rueda Rueda, José Luis Huertas Díaz