Test and Design-for-Testability in Mixed-Signal Integrated Circuits

Häftad, Engelska, 2010

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Test and Design-for-Testability in Mixed-Signal Integrated Circuits deals with test and design for test of analog and mixed-signal integrated circuits. Besides these specification-driven testing techniques, fault-driven approaches are described as they offer potential solutions which are more similar to digital test methods.

Produktinformation

Utgivningsdatum2010-12-07
Mått170 x 244 x 18 mm
Vikt482 g
FormatHäftad
SpråkEngelska
Antal sidor298
FörlagSpringer-Verlag New York Inc.
ISBN9781441954220

Tillhör följande kategorier

0 Introduction.- 1 Mixed-Signal Test.- 2 Analog and Mixed Signal Test Bus: IEEE 1149.4 Test Standard.- 3 Test of A/D Converters.- 4 Phased Locked Loop Test Methodologies.- 5 Behavioral Testing of Mixed-Signal Circuits.- 6 Behavioral Modeling of Multistage ADCs and its Use for Design, Calibration and Test.- 7 DFT and BIST Techniques for Embedded Analog Integrated Filters.- 8 Oscillation-based Test Strategies.