Terrestrial Neutron-induced Soft Error In Advanced Memory Devices
Inbunden, Engelska, 2008
Av Takashi Nakamura, Eishi Ibe, Mamoru Baba, Yasuo Yahagi, Hideaki Kameyama, Japan) Nakamura, Takashi (Tohoku Univ, Japan) Ibe, Eishi (Hitachi Ltd, Japan) Baba, Mamoru (Tohoku Univ, Japan) Yahagi, Yasuo (Hitachi Ltd, Japan) Kameyama, Hideaki (Renesas Technology Corp, AL TAKASHI NAKAMURA ET
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Terrestrial neutron-induced soft errors in semiconductor memory devices are currently a major concern in reliability issues. Understanding the mechanism and quantifying soft-error rates are primarily crucial for the design and quality assurance of semiconductor memory devices.This book covers the relevant up-to-date topics in terrestrial neutron-induced soft errors, and aims to provide succinct knowledge on neutron-induced soft errors to the readers by presenting several valuable and unique features.
Produktinformation
- Utgivningsdatum2008-04-03
- Mått162 x 237 x 20 mm
- Vikt654 g
- FormatInbunden
- SpråkEngelska
- Antal sidor368
- FörlagWorld Scientific Publishing Co Pte Ltd
- ISBN9789812778819