Model-Based Testing for Embedded Systems
Justyna Zander, Ina Schieferdecker, Pieter J. Mosterman, USA) Zander, Justyna (Harvard University, Cambridge, Massachusetts, Germany) Schieferdecker, Ina (Fraunhofer Institute FOKUS, Freie Universitat, Berlin, USA) Mosterman, Pieter J. (MathWorks, Natick, Massachusetts
1 469 kr