Del 45 - Springer Series in Optical Sciences
Scanning Electron Microscopy
Physics of Image Formation and Microanalysis
Inbunden, Engelska, 1998
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Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
Produktinformation
- Utgivningsdatum1998-09-17
- Mått155 x 235 x 35 mm
- Vikt975 g
- FormatInbunden
- SpråkEngelska
- SerieSpringer Series in Optical Sciences
- Antal sidor529
- Upplaga2
- FörlagSpringer-Verlag Berlin and Heidelberg GmbH & Co. KG
- ISBN9783540639763