Run-to-Run Control in Semiconductor Manufacturing
Inbunden, Engelska, 2000
Av James Moyne, Enrique del Castillo, Arnon M. Hurwitz, USA) Moyne, James (University of Michigan, Ann Arbor, USA) del Castillo, Enrique (Pennsylvania State University, University Park, USA) Hurwitz, Arnon M. (Friendswood, Texas, Enrique Del Castillo
2 409 kr
Tillfälligt slut
Run-to-run (R2R) control is cutting-edge technology that allows modification of a product recipe between machine "runs," thereby minimizing process drift, shift, and variability-and with them, costs. Its effectiveness has been demonstrated in a variety of processes, such as vapor phase epitaxy, lithography, and chemical mechanical planarization. The only barrier to the semiconductor industry's widespread adoption of this highly effective process control is a lack of understanding of the technology. Run to Run Control in Semiconductor Manufacturing overcomes that barrier by offering in-depth analyses of R2R control.
Produktinformation
- Utgivningsdatum2000-11-30
- Mått156 x 234 x 22 mm
- Vikt625 g
- SpråkEngelska
- Antal sidor366
- FörlagTaylor & Francis Inc
- EAN9780849311789