Del 272

Progress in Nanoscale Characterization and Manipulation

Inbunden, Engelska, 2018

Av Rongming Wang, Chen Wang, Hongzhou Zhang, Jing Tao, Xuedong Bai

2 239 kr

Beställningsvara. Skickas inom 7-10 vardagar
Fri frakt för medlemmar vid köp för minst 249 kr.

This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research.The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field.

Produktinformation

Du kanske också är intresserad av