Characterization and Control of Interfaces for High Quality Advanced Materials II
Kevin Ewsuk, Kiyoshi Nogi, Rolf Waesche, Yukichi Umakoshi, Tom Hinklin, Keizo Uematsu, Tony Tomsia, Hiroya Abe, Hidehiro Kamiya, Makio Naito, Kevin (Sandia National Laboratories) Ewsuk, Kiyoshi (Osaka University) Nogi, Rolf (Federal Institute for materials Research and Testing (BAM)) Waesche, Keizo (Nagaoka University of Technology) Uematsu, Makio (Osaka University) Naito
2 539 kr