Losses of Fabricated SOI Slot Waveguides

This work aims to estimate experimentally and theoretically the losses of the SOI slot waveguide, classify them according to their sources, study the influence of the characteristics of this type of waveguides on those losses, and introduce a comprehensive analysis about the performance of this device. The scenario will include test and measure the transmission of about 200 slot devices with different characteristics and simulate them in order to solve their modes and find the losses and their sources.