Lecture Notes in Analog Electronics

Prof. Vančo Litovski was born in 1947 in Rakita (alleged birthplace of Olympias of the Molossians, the mother of Alexander, the Great, of Macedonia), South Macedonia, Greece. He graduated from the Faculty of Electronic Engineering in Niš in 1970, and obtained his M.Sc. in 1974, and his Ph.D. in 1977. He was appointed as a teaching assistant at the Faculty of Electronic Engineering in 1970 and became a Full Professor at the same faculty in 1987. He was elected as Visiting Professor (honoris causa) at the University of Southampton in 1999. From 1987 until 1990, he was a consultant to the CEO of Ei, and was Head of the Chair of Electronics at the Faculty of Electronic Engineering in Niš for 12 years. From 2015 to 2017, he was a researcher at the University of Bath. He has taught courses related to analogue electronics, electronic circuit design, and artificial intelligence at the electro-technical faculties in Priština, Skopje, Sarajevo, Banja Luka, and Novi Sad. He received several awards including from the Faculty of Electronic Engineering (Charter in 1980, Charter in 1985, and a Special Recognition in 1995) and the University of Niš (Plaque 1985). Prof. Litovski has published 6 monographs, over 400 articles in international and national journals and at conferences, 25 textbooks, and more than 40 professional reports and studies. His research interests include electronic and electrical design and design for sustainability, and he led the design of the first custom commercial digital and research-oriented analogue CMOS circuit in Serbia. He has also headed 8 strategic projects financed by the Serbian and Yugoslav governments and the JNA and has participated in several European projects funded by the governments of Germany, Austria, UK, and Spain, and the EC as well as the Black See Organization of Economic Cooperation (BSEC).

• Basics.- Testing Analog Circuits.- Fault Simulation In Linear Electronic Circuits.- Fault Simulation In Non-Linear Analog Circuits.- Testing Combinational Logic Mixed Signal Testing.