Focused Ion Beam Systems
Basics and Applications
Inbunden, Engelska, 2007
1 559 kr
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Fri frakt för medlemmar vid köp för minst 249 kr.This edited volume, first published in 2007, comprehensively covers the focused ion beam and two beam technology. Presenting the basic principles, capabilities, challenges, advantages, applications and when best to implement the technology, this is a valuable resource for researchers in materials science, electrical engineering and nanotechnology.
Produktinformation
- Utgivningsdatum2007-09-13
- Mått252 x 180 x 29 mm
- Vikt862 g
- FormatInbunden
- SpråkEngelska
- Antal sidor408
- FörlagCambridge University Press
- ISBN9780521831994