Data & IT
Electrothermal Analysis of VLSI Systems
Yi-Kan Cheng • Ching-Han Tsai • Chin-Chi Teng • Sung-Mo Kang
Inbunden
1999:-
Uppskattad leveranstid 7-11 arbetsdagar
Fri frakt för medlemmar vid köp för minst 249:-
Andra format:
- Pocket/Paperback 1999:-
Electrothermal Analysis of VLSI Systems addresses electrothermal problems in modern VLSI systems. Part I, The Building Blocks, discusses electrothermal phenomena and the fundamental building blocks that electrothermal simulation requires (including power analysis, temperature-dependent device modeling, thermal/electrothermal simulation, and experimental setup-calibration). Part II, The Applications, discusses three important applications of VLSI electrothermal analysis including temperature-dependent electromigration diagnosis, cell-level thermal placement and temperature-driven power and timing analysis. Electrothermal Analysis of VLSI Systems will be useful for researchers in the fields of IC reliability analysis and physical design, as well as VLSI designers and graduate students.
- Format: Inbunden
- ISBN: 9780792378617
- Språk: Engelska
- Antal sidor: 210
- Utgivningsdatum: 2000-06-01
- Förlag: Springer