Electromigration Modeling at Circuit Layout Level
Häftad, Engelska, 2013
689 kr
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Integrated circuit (IC) reliability is of increasing concern in present-day IC technology where the interconnect failures significantly increases the failure rate for ICs with decreasing interconnect dimension and increasing number of interconnect levels.
Produktinformation
- Utgivningsdatum2013-05-04
- Mått155 x 235 x 7 mm
- Vikt189 g
- FormatHäftad
- SpråkEngelska
- SerieSpringerBriefs in Applied Sciences and Technology
- Antal sidor103
- FörlagSpringer Verlag, Singapore
- ISBN9789814451208
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