Design, Analysis and Test of Logic Circuits Under Uncertainty 1

Data & IT

Design, Analysis and Test of Logic Circuits Under Uncertainty

Smita Krishnaswamy • Igor L Markov • John P Hayes

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124 sidor
2014

Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior.

Författare: Smita Krishnaswamy, Igor L Markov, John P Hayes
Format: Pocket/Paperback
ISBN: 9789400797987
Språk: Engelska
Antal sidor: 124
Utgivningsdatum: 2014-10-15
Förlag: Springer