Contactless VLSI Measurement and Testing Techniques

Häftad, Engelska, 2018

AvSelahattin Sayil

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The author highlights the inherent difficulties encountered with the mechanical probe and testability design approaches for functional and internal fault testing and shows how contactless testing might resolve many of the challenges associated with conventional mechanical wafer testing.

Produktinformation

Utgivningsdatum2018-09-04
Mått155 x 235 x 6 mm
Vikt184 g
FormatHäftad
SpråkEngelska
Antal sidor93
FörlagSpringer International Publishing AG
ISBN9783319888194

Tillhör följande kategorier

1. Conventional Test Methods. – 2. Testability Design.- 3. Other Techniques Based on the Contacting Probe.- 4. Contactless Testing.- 5. Electron-Beam and Photoemission Probing.- 6. Electro Optic Sampling and Charge Density Probe.- 7. Electric Force Microscope, Capacitive Coupling and Scanning Magneto-Resistive Probe.- 8. Probing Techniques Based on Light Emission from Chip.- 9. All Silicon Optical Technology for Contactless Testing of Integrated Circuits.- 10. Comparison of Contactless Testing Methodologies.