Vetenskap & teknik
Characterisation of Radiation Damage by Transmission Electron Microscopy
M L Jenkins • M A Kirk • M L Jenkins • M A Kirk
Inbunden
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Details the electron microscopy methods used to investigate complex and fine-scale microstructures, such as those produced by fast-particle irradiation of metals or ion implantation of semiconductors. This book also focuses on the methods used to characterize small point-defect clusters, such as dislocation loops.
- Format: Inbunden
- ISBN: 9780750307482
- Antal sidor: 234
- Utgivningsdatum: 2000-11-21
- Förlag: Taylor & Francis Ltd