ZnTe films deposited using SILAR method

This book includes the FTIR characterization of ZnTe in thin film forms. Thin films of ZnTe have been prepared by SILAR method at different thickness and also at different annealing temperature. The radiative properties: mostly transmittance of ZnTe thin films in far infrared have been investigated using FTIR spectroscopy, suggesting their possible use as IR transmission windows. The detailed analysis of these results has been carried out in this book.