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These papers from the conference of March and April 2003 examine recent advances in semiconductor studies conducted through microscopy. Many address issues of high resolution imaging and nanoanalysis with special application to quantum-scale structures. Other topics receiving attention here include electron microscope lens correctors, advanced scan
- Format: Inbunden
- ISBN: 9780750309790
- Språk: Engelska
- Antal sidor: 686
- Utgivningsdatum: 2004-04-01
- Förlag: Institute of Physics Publishing