Mathematical Challenges in Electron Microscopy

Mathematical Challenges in Electron Microscopy, Volume 232 of Advances in Imaging and Electron Physics series, highlights new advances in the field, with this new volume presenting interesting chapters on topics, including Charged Particles in Electromagnetic Fields, Language of Aberration Expansions in Charged Particle Optics, Transporting Charged Particle Beams in Static Fields, Transporting Charged Particles in Radiofrequency Fields, Transporting and Separating Ions in Gas-Filled Channels, Static Magnetic Charged Particle Analyzers, Electrostatic Energy Analyzers, Mass Analyzers With Combined Electrostatic and Magnetic Fields, and much more.

Additional chapters cover Mass Analyzers based on Fourier Transform, Principles of Time-of-Flight Mass Analyzers, Multi-Pass Time-of-Flight Mass Analyzers, and Radiofrequency Mass Analyzers.

• Provides the authority and expertise of leading contributors from an international board of authors
• Presents the latest release in the Advances in Imaging and Electron Physics series
• Covers mathematical challenges in electron microscopy