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The reliability of InGaN/GaN light emitting diodes (LEDs) with different emission wavelengths and different geometries was studied. Device performances, like current-voltage characteristics, 1/f noise spectrum, leakage, static resistance, were measured. The devices underwent a 1000-hr constant-current stress test and their optical output degradation rate was examined. The results were explained by cross-related data.
- Format: Pocket/Paperback
- ISBN: 9783844395297
- Språk: Engelska
- Antal sidor: 80
- Utgivningsdatum: 2011-05-17
- Förlag: LAP Lambert Academic Publishing