Fundamentals of Microstructural Characterization of Materials
- Nyhet
Häftad, Engelska, 2025
Av Hamid Garmestani, Navid Nasajpour Esfahani, USA) Garmestani, Hamid (Professor, Department of Materials Science and Engineering, Georgia Institute of Technology, USA) Esfahani, Navid Nasajpour (Ph.D. Candidate, Georgia Institute of Technology
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Fri frakt för medlemmar vid köp för minst 249 kr.Fundamentals of Microstructure Characterization of Materials is an essential resource for understanding the various techniques and methods used in material characterization. This book delves into spectroscopic methods involving electromagnetic radiation, X-ray photoelectron analysis, atomic emission spectroscopy, and more. It provides thorough explanations of scanning electron microscopy and sample preparation techniques, including cutting, grinding, polishing, and etching.
Other important points covered in the book include microscopy fundamentals such as lens types, optical image formation principles, depth of field, and depth of focus. Statistical analysis methods, including cumulative distribution function, probability density function, and Gaussian distribution, are also discussed. Additionally, the application of X-ray diffraction in phase analysis of materials is explored in detail.
Other important points covered in the book include microscopy fundamentals such as lens types, optical image formation principles, depth of field, and depth of focus. Statistical analysis methods, including cumulative distribution function, probability density function, and Gaussian distribution, are also discussed. Additionally, the application of X-ray diffraction in phase analysis of materials is explored in detail.
- Covers a wide range of concepts and techniques for the accurate characterization of the microstructure of a variety of materials, including metals, ceramics, and polymers
- Outlines spectroscopic, scanning electron microscope, X-ray diffraction, and other characterization methods
- Discusses microscopy fundamentals, statistical analysis, and sample preparation methods
Produktinformation
- Utgivningsdatum2025-11-01
- Mått152 x 229 x undefined mm
- Vikt450 g
- FormatHäftad
- SpråkEngelska
- Antal sidor400
- FörlagElsevier Science
- ISBN9780443341892